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image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao IEEE Design & Test o...arrow_drop_down
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
IEEE Design & Test of Computers
Article . 2008 . Peer-reviewed
License: IEEE Copyright
Data sources: Crossref
DBLP
Article . 2008
Data sources: DBLP
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The State of ESL Design [Roundtable]

Authors: Reinaldo A. Bergamaschi; Luca Benini; Krisztián Flautner; Wido Kruijtzer; Alberto L. Sangiovanni-Vincentelli; Kazutoshi Wakabayashi;

The State of ESL Design [Roundtable]

Abstract

This is the first of two roundtables on electronic system-level design in this issue of IEEE Design & Test. ESL design and tools have been present in the design landscape for many years. Significant ESL innovations are now part of most advanced design methodologies, spanning the domains of modeling, simulation, and synthesis. Techniques such as transaction-level modeling, automatic interconnection generation, behavioral synthesis, automatic instruction-set customization, retargetable compilers, and many others are currently used in the design of multimillion-gate chips. Yet, ESL design still seems to struggle to live up to the promise of providing increased productivity and design quality. This roundtable examines these issues and attempts to provide a definite picture of where ESL design is today and where it might be in the next five to 10 years. The participants in this roundtable include well-known experts in ESL design from the user side, universities, and tool providers. IEEE Design & Test thanks the roundtable participants: moderator Reinaldo Bergamaschi (CadComponents), Luca Benini (University of Bologna), Krisztian Flautner (ARM UK), Wido Kruijtzer (NXP Semiconductors), Alberto Sangiovanni-Vincentelli (University of California, Berkeley), and Kazutoshi Wakabayashi (NEC Japan). D&T gratefully acknowledges the help of Roundtables Editor Bill Joyner (Semiconductor Research Corp.), who organized the event.

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Powered by OpenAIRE graph
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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
2
Average
Average
Average
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