
doi: 10.1109/mdt.2007.78
This article describes a full-die dynamic model of an Intel Pentium IV microprocessor design. The authors show that transient supply noise is sensitive to nonuniform decoupling-capacitor distribution, and that supply-drop locality is a tight function of frequency and package-die resonance, leading to significant localized resonant effects.
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 22 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Top 10% | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Top 10% |
