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image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao IEEE Control Systems...arrow_drop_down
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
IEEE Control Systems Magazine
Article . 2012 . Peer-reviewed
License: IEEE Copyright
Data sources: Crossref
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ACC 2013 in Washington, D.C. [ACC Preview]

Authors: Lucy Pao; Daniel Abramovitch;

ACC 2013 in Washington, D.C. [ACC Preview]

Abstract

The author provides an overview of the upcoming 2013 American Control Conference (ACC). ACC will be held in Washington, D.C. Monday through Wednesday, 17-19 June 2013, with workshops being planned for the Saturday and Sunday (15?16 June 2013) beforehand. The ACC is the annual conference of the American Automatic Control Council [AACC, the United States national member organization of the International Federation of Automatic Control (IFAC)]. The eight national and international society cosponsors of the ACC include the American Institute of Aeronautics and Astronautics (AIAA), the American Institute of Chemical Engineers (AIChE), the American Society of Civil Engineers (ASCE), the American Society of Mechanical Engineers (ASME), the IEEE, the International Society of Automation (ISA), the Society for Modeling and Simulation International (SCS), and the Society for Industrial and Applied Mathematics (SIAM). The technical program will feature theme tracks in sustainability, societal challenges for control, and smart healthcare systems. Each theme will include a semiplenary and special track, including tutorial and invited sessions. In addition to the special themes, the conference technical, (semi-)plenary, and special sessions will reflect the diversity of theory and applications of control that is one of the hallmarks of an ACC.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
Average
Average
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