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image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
IEEE Communications Magazine
Article . 2012 . Peer-reviewed
License: IEEE Copyright
Data sources: Crossref
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
IEEE Communications Magazine
Article . 2011 . Peer-reviewed
License: IEEE Copyright
Data sources: Crossref
DBLP
Article . 2012
Data sources: DBLP
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Network testing series [Series Editorial]

Authors: Ying-Dar Lin; Erica Johnson; Eduardo Joo;

Network testing series [Series Editorial]

Abstract

Slightly different from the previous two issues, this issue consists of one contribution from open calls, on reusing simulated code onto the experimented wireless platforms, and two invited contributions from National Chiao Tung University Network Benchmarking Laboratory (NCTU-NBL), on false positive/negative analysis of intrusion detection, and the University of New Hampshire InterOperability Laboratory (UNH-IOL), on interoperability testing of the emerging Ethernet-centric data center bridging. These two laboratories are directed by two of the editors of this series. The invited submissions also went through the review process to check and improve their quality. The major reason we invited our colleagues to submit to this series was based on an observation made in the last issue: Soliciting highly industry-oriented submissions from the test laboratories and test equipment providers might be more promising than soliciting from the manufacturers. Although we do not rule out the possibility of submissions from manufacturers, our experiences have indicated us they are either too busy to write at the quality we require or reluctant to leak test results on their own products. The open calls for future issues are still valid, with two due dates on June 1 and December 1 every year. But we shall continue to invite contributions from the leading test laboratories and test equipment providers. The inputs from NBL and IOL in this issue serve as the first move and also an example in soliciting these types of input.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
Average
Average
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