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Emission microscope studies on FEAs

descriptionPublicationkeyboard_double_arrow_right Article 27 Nov 2002Publisher:IEEEJournal:Eleventh International Vacuum Microelectronics Conference. IVMC'98 (Cat. No.98TH8382)
Authors: Hiroshi Adachi; K. Yamane; Satoru Kawata; Hideaki Nakane; Yasufumi Muto;

doi: 10.1109/ivmc.1998.728655

Emission microscope studies on FEAs

Abstract

Electron emission from a FEA was magnified by making use of an emission microscope, and the uniformity of the electron emission was examined. By resolving the electron emission from each microtip, the electron emission stability from a single microtip was successfully measured.

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citations
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
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