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Low on-resistance in inversion channel IEMOSFET formed on 4H-SiC C-face substrate

Authors: S. Harada; M. Kato; M. Okamoto; T. Yatsuo; K. Fukuda; K. Arai;

Low on-resistance in inversion channel IEMOSFET formed on 4H-SiC C-face substrate

Abstract

The inversion channel IEMOSFET has been fabricated on the 4H-SiC carbon-face substrate. The channel resistance was successfully reduced to 1 mOmegacm2 due to the high inversion channel mobility on the carbon-face epitaxial layer. The extremely low specific on-resistance of 2.7 mOmegacm2 was achieved with the blocking voltage of 700V. This specific on-resistance is the lowest in the normally-off MOSFET with the blocking voltage higher than 600 V

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    influence
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Powered by OpenAIRE graph
Found an issue? Give us feedback
selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
7
Average
Top 10%
Top 10%
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