SET response of FinFET-based majority voter circuits under work-function fluctuation

descriptionPublicationkeyboard_double_arrow_right Article , Conference object 01 Dec 2017Publisher:IEEEJournal:2017 24th IEEE International Conference on Electronics, Circuits and Systems (ICECS)

Authors: Y. Q. de Aguiar; Fernanda Lima Kastensmidt; Cristina Meinhardt; Ricardo A. L. Reis;

doi: 10.1109/icecs.2017.8292064

SET response of FinFET-based majority voter circuits under work-function fluctuation

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Abstract

This work evaluates the SET response of FinFET-based Majority Voter circuits under the process-variability impact of metal-gate Work-Function Fluctuation (WFF). Results show that SET pulsewidth is expected to increase under WFF effects. Moreover, results show that the relative standard deviation of the SET pulses can increase from 50% up to 80% according to the adopted transistor sizing.

Related Organizations

Universidade Federal do Rio Grande do Sul
Brazil
Federal University Foundation of Rio Grande
Brazil
Federal University of Rio Grande do Sul
Brazil

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