we propose a design for testability of arbitrary combinational Quantum Dot Cellular Automata (QCA) logic, which facilitates its functionality testing. Any combinational logic can be implemented using only AND-OR gates (with negated signals available), and in QCA this results in reduced test set. Previously this strategy was proposed for QCA testing considering only primary inputs (either true or complemented, but not both) feeding different majority voters, which fails for general circuits where fan-outs are allowed for primary inputs and their complement. In this paper we propose a design scheme that enables testing of any combinational QCA circuit.