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Reverse Engineering of Split Manufactured Sequential Circuits Using Satisfiability Checking

Authors: Suyuan Chen; Ranga Vemuri;

Reverse Engineering of Split Manufactured Sequential Circuits Using Satisfiability Checking

Abstract

Split Manufacturing was proposed as a promising strategy to thwart reverse engineering and Trojan insertion at untrusted foundries. However, attack methods based on physical design hints have been proposed to reverse engineer a combinational circuit with Front-End-Of-line (FEOL) layers only. But none of them can guarantee 100% recovery of BEOL signals since no validation can be done during the attack process. In this paper, we introduce an attack flow that can recover 100% BEOL signals for sequential circuits effectively. Our approach shows promising results in attacking sequential circuits without access to flip-flop outputs. We demonstrate the effectiveness of the new attack method on a set of sequential benchmarks from ISCAS-89 and ITC-99 sets which have been widely used in related research. Results show logic equivalence between the original circuit and the recovered circuit for all benchmarks.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
2
Average
Average
Average
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