Tracing the Defect Location (TDL)
Copyright policy ) Jeong-Cheol Lee; Dae-Young Kim;
Tracing the Defect Location (TDL)
TDL is the system that converts the analog process to digital process. During the process of building the substrate, there can be many defects which are generated by both a human and other environmental things. To reduce the redundant process like handling by human-beings, TDL can substitute physical operation for logical process.
- Dalian Polytechnic University China (People's Republic of)
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These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
Citations provided by BIP!popularityPopularity provided by BIP!
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
Popularity provided by BIP! 0
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