We present a Silicon-on-Insulator based Look-up Table and configuration memory for application within a radiation hard reconfigurable system. The configuration storage includes a non-volatile EEPROM built using a standard single poly silicon Silicon on Insulator CMOS process linked to a Schmitt sense amplifier and transmission gate LUT structure. A simple current detector of the type used in conventional RAM circuits allows the configuration memory to be set up to exhibit self correcting, or "auto-scrubbing" behavior. While the SOI EEPROM and Schmitt exhibit high intrinsic resistance to radiation induced errors, it is still possible for a sequence of two particle strikes to cause the configuration value to be lost. We undertake a preliminary analysis of the Single Event error Rate (SER) performance that results from this behavior.