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Critical size of crack propagation from residual void in micro via in printed wiring boards

Authors: Hyo-Soo Lee;

Critical size of crack propagation from residual void in micro via in printed wiring boards

Abstract

The micro-via was fabricated with diameter of 200 to 400μm, inner hole plate thickness of 18μm, hole land thickness of 18 to 20μm, and solder resist thickness of 13μm on hole land. We investigated that the size of residual void increased as that of micro-via increased; also, dominance of micro-via cracking was observed when temperature was applied at 100°C for 2 hours. When the printed circuit board containing void is heated, the micro-via cracking is accelerated in the micro-via with residual void larger than 50% of via diameter. This is significantly verified by calculation of coefficient for stress concentration in the study.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
1
Average
Average
Average
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