Yield prediction by sampling with the EYES tool

descriptionPublicationkeyboard_double_arrow_right Article , Conference object 23 Dec 2002Publisher:IEEE Comput. Soc. PressJournal:Proceedings. 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Authors: Gerard A. Allan; Anthony J. Walton;

doi: 10.1109/dftvs.1996.571983

Yield prediction by sampling with the EYES tool

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Abstract

This paper reports a software system EYES (Edinburgh Yield Estimator Sampling) for the yield prediction of ULSI devices. The system implements the survey sampling based methodology for critical area estimation and yield prediction. This methodology is not limited by the size of the device or the design hierarchy and can provide yield predictions in a reasonable time for even the largest devices, using modest computing resources.

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University of Edinburgh
United Kingdom

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