
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The proposed method can be used with any test generation procedure to improve the effectiveness of the tests in detecting un-modeled defects. Experimental results on several industrial designs show the effectiveness of defect aware tests. We also propose a measure to estimate the effectiveness of given test sets in detecting un-modeled defects.
[INFO.INFO-AR] Computer Science [cs]/Hardware Architecture [cs.AR], [SPI.TRON] Engineering Sciences [physics]/Electronics
[INFO.INFO-AR] Computer Science [cs]/Hardware Architecture [cs.AR], [SPI.TRON] Engineering Sciences [physics]/Electronics
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