Single photon absorption laser facility for single event effect testing

descriptionPublicationkeyboard_double_arrow_right Article , Conference object 01 May 2016Publisher:IEEEJournal:2016 IEEE Canadian Conference on Electrical and Computer Engineering (CCECE)

Authors: Michael Newton; Brook Danger; Li Chen 0001; Ramaswami Sammynaiken; Haibin Wang; David M. Hiemstra; Valeri Kirischian;

doi: 10.1109/ccece.2016.7726601

Single photon absorption laser facility for single event effect testing

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Abstract

The laser testing facility for single event effects (SEEs) at the Saskatchewan Structural Sciences Centre, University of Saskatchewan is introduced and its principles of operation described. An ultrafast pulsed laser setup is used to investigate the SEE behavior of microelectronic circuits and devices. The capabilities of the system as they relate to SEE generation via single photon absorption are described. Single event transient (SET) data obtained for an Optek OMH3075 Hall effect sensor are provided. The Optek laser data is compared with heavy ion data previously collected.

Related Organizations

MacDonald, Dettwiler and Associates
United States
University of Saskatchewan
Canada
Maxar Technologies (United States)
United States

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