TI-BIST: a temperature independent analog BIST for switched-capacitor filters

descriptionPublicationkeyboard_double_arrow_right Article , Conference object 08 Nov 2002Publisher:IEEE Comput. SocJournal:Proceedings of the Ninth Asian Test Symposium

Authors: Luigi Carro; Érika F. Cota; Marcelo Lubaszewski; Yves Bertrand; Florence Azaïs; Michel Renovell;

doi: 10.1109/ats.2000.893606

TI-BIST: a temperature independent analog BIST for switched-capacitor filters

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Abstract

This paper describes a method to obtain a temperature independent analog BIST. The test procedure is based on the reuse of existing analog circuits, configured either as stimuli generators or as signature analyzers. The paper explains the general problem of temperature deviation present in analog BIST, and shows an approach to overcome this limitation, validated by simulation results.

Related Organizations

Universidade Federal do Rio Grande do Sul
Brazil
Federal University of Rio Grande do Sul
Brazil

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