Present-day electromagnetic simulators are capable of simulating systems and devices with a larger number of design parameters. The next challenge is to use such simulators in order to provide parametric simulation and optimization in a high-dimensional design space, while minimizing the number of calls to the electromagnetic simulator, and providing means to estimate design sensitivity in an efficient and scalable manner. This paper presents a technique for sensitivity analysis, based on Taguchi's method and the analysis of variance (ANOVA). The method shows promise in tests involving parasitic extraction of large designs.