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Microwave noise in InP/InGaAs composite channel high electron mobility transistors (HEMTs)

Authors: null Yuwei Liu; Hong Wang; null Rong Zeng;

Microwave noise in InP/InGaAs composite channel high electron mobility transistors (HEMTs)

Abstract

In this work, the study of the microwave noise performance for InGaAs/InP composite channel HEMT compared to InGaAs channel is performed. Detailed microwave noise characteristics of InP-based HEMT are presented. An interesting observation is that the minimum noise figure (NF/sub min/) in composite channel devices is insensitive to drain bias, which is different from the conventional single channel devices in which the minimum noise figure increases with the increase of the bias. An analytical model was provided to study the channel noise for both devices and verify the influence of the different channel structure on the noise performance.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
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