On the diagnostic properties of linear feedback shift registers

descriptionPublicationkeyboard_double_arrow_right Article 01 Jan 1991Publisher:Institute of Electrical and Electronics Engineers (IEEE)Journal:IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, volume 10, pages 1,316-1,322 (issn: 0278-0070,

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Authors: Janusz Rajski; Jerzy Tyszer;

doi: 10.1109/43.88927

On the diagnostic properties of linear feedback shift registers

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Abstract

The authors study the relation between the length of the linear feedback shift register (LFSR), the size of the circuit (which defines the size of the fault list), and the quality of diagnostic resolution. They present an analytical model that is used to obtain a simple formula determining the fraction of faults that are uniquely diagnosed for a given circuit size and the LFSR length. The model is verified through extensive experiments on benchmark circuits. >

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