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image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao IEEE Control Systems...arrow_drop_down
image/svg+xml Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao Closed Access logo, derived from PLoS Open Access logo. This version with transparent background. http://commons.wikimedia.org/wiki/File:Closed_Access_logo_transparent.svg Jakob Voss, based on art designer at PLoS, modified by Wikipedia users Nina and Beao
IEEE Control Systems Magazine
Article . 1988 . Peer-reviewed
License: IEEE Copyright
Data sources: Crossref
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Sensing and recognition of rigid objects using structured light

Authors: G.C. Stockman; S.-W. Chen; G. Hu; N. Shrikhande;

Sensing and recognition of rigid objects using structured light

Abstract

Word directed toward the development of a vision system for bin picking of rigid 3D objects is reported. Any such system must have components for sensing, feature extraction, modeling, and matching. A structured light system which attempts to deliver a rich 2/sup 1///sub 2/D representation of the scene is described. Surface patches are evident as connected sets of stripes whose 3D coordinates are computed by means of triangulation and constraint propagation. Object edges are detected by the intersection of surface patches or by backprojecting image edges to intersect with the patches. Two matching paradigms are given for drawing correspondence between structures in the scene representation and structures in models. Three major contributions are reported: a method for sensing object surface patches without having to solve uniquely for stripe labels; the use of both an intensity image and a striped image, allowing scenes to be represented by detected edges along with 3D surface patches; and a pose-clustering algorithm, a uniform technique to accumulate matching evidence for recognition while averaging out substantial errors of pose. >

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
19
Average
Top 10%
Average
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