Single-event upset in the PowerPC750 microprocessor

descriptionPublicationkeyboard_double_arrow_right Article 01 Dec 2001Publisher:Institute of Electrical and Electronics Engineers (IEEE)Journal:IEEE Transactions on Nuclear Science, volume 48, pages 1,822-1,827 (issn: 0018-9499, eissn: 1558-1578,

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Authors: G.M. Swift; F.F. Fannanesh; S.M. Guertin; F. Irom; D.G. Millward;

doi: 10.1109/23.983136

Single-event upset in the PowerPC750 microprocessor

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Abstract

Proton and heavy ion upset susceptibility has been measured individually for six types of storage elements in an advanced commercial processor, the PowerPC750, from two manufacturers: Motorola and IBM. Data on interfering program malfunctions was also collected. Compared to earlier PPC603e results, the upset susceptibility has decreased somewhat.

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