Picosecond time interval measurements

descriptionPublicationkeyboard_double_arrow_right Article 01 Apr 1995Publisher:Institute of Electrical and Electronics Engineers (IEEE)Journal:IEEE Transactions on Instrumentation and Measurement, volume 44, pages 284-287 (issn: 0018-9456,

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Authors: J.B. Rettig; L. Dobos;

doi: 10.1109/19.377832

Picosecond time interval measurements

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Abstract

Efficient measurement techniques have been developed to adequately characterize the performance of a new generation of programmable equivalent time sequential sampling oscilloscopes. These instruments provide time interval measurements with increased repeatability and accuracy. The same characterizations are applicable to more general time interval measurement, and subpicosecond repeatability for rise time measurement of fast step generators ( >

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