On linear dependencies in subspaces of LFSR-generated sequences

descriptionPublicationkeyboard_double_arrow_right Article 01 Jan 1996Publisher:Institute of Electrical and Electronics Engineers (IEEE)Journal:IEEE Transactions on Computers, volume 45, pages 1,212-1,216 (issn: 0018-9340,

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Authors: Janusz Rajski; Jerzy Tyszer;

doi: 10.1109/12.543715

On linear dependencies in subspaces of LFSR-generated sequences

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Abstract

Summary: The probability of linear dependency in subsequences generated by linear feedback shift registers is examined. It is shown that this probability for a short subsequence, e.g., a sequence defined by the length of a scan chain, can be much higher than that for an entire \(m\)-sequence.

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Keywords

shift registers, built-in self-test, Fault detection; testing in circuits and networks, Reliability, testing and fault tolerance of networks and computer systems

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