In the search for on or off‐line methods for condition monitoring of wear sensitive components, Thin Layer Activation (TLA) has much to offer. It is possible to measure very small surface losses directly, and by the use of double layer, or direct, or indirect sentinel layer modifications, wear of material to any depth can be measured. The technique can be applied to most materials and extended to virtually all materials and components by the use of treated plugs or inserts. Material loss can often be measured under operating conditions without dismantling equipment. The technique is reliable and of known useful life, ie there can be no electrical or mechanical failures of the implanted layer. The total radioactivity is very low and no modification of material surface properties is likely. The use of TLA in condition monitoring will speed up the identification of incipient faults.