
pmid: 10004655
The effect of voltage-dependent capacitance on the Coulomb blockade is discussed. The effect is caused by the redistribution of the voltage-induced charge on the capacitor plates. A semiconducting microstructure for observation of this effect is proposed. Its energy-charge dependence is obtained by means of Thomas-Fermi theory. The current-voltage characteristics of the device are obtained using this dependence and the master-equation approach.
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