Characteristic functions for the tip regime in dielectric breakdown

descriptionPublicationkeyboard_double_arrow_right Article 01 Nov 1990 English Publisher:American Physical Society (APS)Journal:Physical Review B, volume 42, pages 8,655-8,657 (issn: 0163-1829, eissn: 1095-3795,

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Authors: , Alstrom;

doi: 10.1103/physrevb.42.8655

pmid: 9995052

Characteristic functions for the tip regime in dielectric breakdown

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Abstract

Nouvelle methode pour obtenir la structure d'echelle de la mesure harmonique des processus de croissance auto-similaires. Cette methode est fondee sur une analyse d'une classe de mesure en regime de decharge

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Boston University
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