X-ray Hanbury Brown-Twiss interferometry for determination of ultrashort electron-bunch duration
Copyright policy )X-ray Hanbury Brown-Twiss interferometry for determination of ultrashort electron-bunch duration
An x-ray Hanbury Brown-Twiss interferometry to diagnose a temporal profile of a femtosecond electron bunch (e-bunch) is presented. We show that intensity interference of spontaneous x-ray radiation from the e-bunch reflects the e-bunch profile. Based on this relationship, a temporal profile of the 8.1-GeV e-bunch at SPring-8 Angstrom Compact free-electron LAser (SACLA) that generates x-ray free-electron laser (XFEL) light is characterized through the intensity interference measurement. Combining this e-bunch profile with a numerical simulation, the XFEL pulse duration generated by the e-bunch is estimated to be less than 10 fs.
- Japan Synchrotron Radiation Research Institute Japan
- RIKEN Japan
- University of Tokyo Japan
Nuclear and particle physics. Atomic energy. Radioactivity, QC770-798
Nuclear and particle physics. Atomic energy. Radioactivity, QC770-798
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