
pmid: 16123071
John Cowley and his group at Arizona State University pioneered the use of transmission electron microscopy for high-resolution imaging. Images were achieved three decades ago showing the crystal unit cell content at better than 4 A resolution. This achievement enabled researchers to pinpoint the positions of heavy atom columns within the unit cell. Lighter atoms appear as resolution is improved to sub-Angström levels. Currently, advanced microscopes can image the columns of the light atoms (carbon, oxygen, nitrogen) that are present in many complex structures, and even the lithium atoms present in some battery materials. Sub-Angström imaging, initially achieved by focal-series reconstruction of the specimen exit surface wave, will become commonplace for next-generation electron microscopes with C(S)-corrected lenses and monochromated electron beams. Resolution can be quantified in terms of peak separation and inter-peak minimum, but the limits imposed on the attainable resolution by the properties of the microscope specimen need to be considered. At extreme resolution the 'size' of atoms can mean that they will not be resolved even when spaced farther apart than the resolution of the microscope.
Atoms, Sub-Angstrom atomic-resolution high-resolution electron microscopy focal-series reconstruction exit-surface wave software aberration correction., Nitrogen, 36 Materials Science, Electron Beams, Lithium, Microscopes, Carbon, Materials science, Oxygen, Sub-Angstrom Atomic-Resolution High-Resolution Electronmicroscopy Focal-Series Reconstruction Exit-Surface Wave Softwareaberration Correction, Resolution, Electron Microscopes, Transmission Electron Microscopy Sub-Angstrom Atomic-Resolution High-Resolution Electronmicroscopy Focal-Series Reconstruction Exit-Surface Wave Softwareaberration Correction, Lenses
Atoms, Sub-Angstrom atomic-resolution high-resolution electron microscopy focal-series reconstruction exit-surface wave software aberration correction., Nitrogen, 36 Materials Science, Electron Beams, Lithium, Microscopes, Carbon, Materials science, Oxygen, Sub-Angstrom Atomic-Resolution High-Resolution Electronmicroscopy Focal-Series Reconstruction Exit-Surface Wave Softwareaberration Correction, Resolution, Electron Microscopes, Transmission Electron Microscopy Sub-Angstrom Atomic-Resolution High-Resolution Electronmicroscopy Focal-Series Reconstruction Exit-Surface Wave Softwareaberration Correction, Lenses
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 30 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Top 10% | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Top 10% | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Top 10% |
