Charge sensitive amplifiers (CSAs) are electronic integrating circuits frequently used for detecting quick charge pulses such as those produced in semiconductor detector devices and electron multipliers. One of the limitations of highly sensitive CSA circuits is the accuracy with which they can be calibrated due to the necessity of using injection capacitors on the order of a few pF, which are difficult to calibrate and to disentangle from other stray capacitance in calibration circuits. This paper presents an alternate method for calibrating the electronics for CSAs with conductive detectors, referred to as the “external conductor” method, using the detector itself to form the injection circuit. The external conductor method is compared to the traditional injection capacitor method for an example detector. The new method results in an increase to the calibration factor of up to 70% over the value derived from a traditional injection capacitor, with an uncertainty in the new value of 2%. Finally, the results from the external conductor method are compared to a third, independent approach, which uses reference charged particles as calibration sources in the Colorado dust accelerator. The results of the charged particle approach corroborate the external conductor calibration to within the stated uncertainty.