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Picosecond electron diffraction

descriptionPublicationkeyboard_double_arrow_right Article 01 Jul 1982 English Publisher:AIP PublishingJournal:Applied Physics Letters, volume 41, pages 44-45 (issn: 0003-6951, eissn: 1077-3118, Copyright policy )
Authors: Gerard Mourou; Steve Williamson;

doi: 10.1063/1.93316

Picosecond electron diffraction

Abstract

A picosecond photoelectron pulse generated by a streak camera has been used to probe a thin film of aluminum producing a diffraction pattern representative of its lattice structure. Because this photoelectron pulse is in picosecond synchronism with the optical pulse, this technique will make possible the investigation of structural phase transitions in the picosecond time domain.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
123
Top 10%
Top 1%
Top 10%
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