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Optical properties of Cd1−xMgxTe epitaxial layers: A variable-angle spectroscopic ellipsometry study

Authors: Michel Luttmann; François Bertin; Amal Chabli;

Optical properties of Cd1−xMgxTe epitaxial layers: A variable-angle spectroscopic ellipsometry study

Abstract

The index of Cd1−xMgxTe ternary alloys was measured for the first time by variable-angle spectroscopic ellipsometry on layers of different concentrations. The ellipsometer’s wide spectral range (0.7–5.6 eV) clearly reveals critical points beyond the gap. Self-consistency of the permittivity measurements is investigated by Kramers–Kronig analysis. A transition layer is revealed at the top surface of the samples and is taken into account as a rough layer. In the transparent region Sellmeier’s law is applied to describe the index behavior as a function of the wavelength and the magnesium content.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
17
Average
Top 10%
Average
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