
doi: 10.1063/1.357675
handle: 11693/25938 , 11693/10759
Four-terminal microcontacts between metallic electrodes develop nonlinear current-voltage dependencies both in the source and control channels as well as between the channels. Theory is presented of the nonlinearity caused by the reabsorption of nonequilibrium phonons emitted in the contact by injected electrons. Temperature of the lattice due to heating by the current is of the order T∼eV/4, which results in substantial increase of the resistance both in the bias direction and in the direction perpendicular to the bias. Performance characteristics of such a device at low temperature compared to the Debye temperature are quite promising for frequencies below 109 Hz.
Electric resistance, Point Contacts, Electrons, Temperature distribution, Thermal effects, Four terminal microcontacts, Metals, Heat transfer, Phonons, Debye temperature, Point contacts, Current voltage response, Calculations, Electrodes, Nonlinearity, Hot spot transistor
Electric resistance, Point Contacts, Electrons, Temperature distribution, Thermal effects, Four terminal microcontacts, Metals, Heat transfer, Phonons, Debye temperature, Point contacts, Current voltage response, Calculations, Electrodes, Nonlinearity, Hot spot transistor
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 3 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
