
doi: 10.1063/1.342811
The low-temperature properties of the excitation-dependent photoluminescence emission, in nominally undoped n-type GaxIn1−x As (0.44≤x≤0.48) layers grown on InP by molecular-beam epitaxy, are investigated with changes of temperature and excitation intensity. The excitation-dependent emission is attributed to the quasi-donor-acceptor pair transition in impure compensated crystals. The random impurity potential arising from residual impurities causes a larger energy shift than expected for the usual donor-acceptor pair transition.
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