
doi: 10.1063/1.327286
Measurements of secondary electron emission yield and inelastic reflection coefficient for monocrystalline CuInTe2 have been made using samples freshly cleaved in ultrahigh vacuum. The yield curve exhibits significant structure which may be explained in terms of primary beam diffraction from (310) planes.
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 1 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Average | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Average | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
