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Effects of nanosized contact spots on thermal contact resistance

Authors: Sangyoung Lee; Yong Hoon Jang; Woochul Kim;

Effects of nanosized contact spots on thermal contact resistance

Abstract

We investigate the effects of nanosized contact spots on the thermal contact resistance (TCR) in multiscale contacts. As the contact size decreases below the phonon mean free path, the thermal conductivity varies with the size of the contact and is not the same as its bulk counterpart. We take this into account in our model and we calculate the TCR of silicon contacted with other silicon. The TCR increases as the number of nanosized contact spots increases. However, if we do not consider the thermal conductivity reduction as the contact size decreases below the size of the phonon mean free path, there is a finite limit of the TCR. A parametric study on the effects of distance and size of the contact spots is also presented.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
8
Average
Average
Average
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