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Printed Circuit Board Evaluation by Holographic Interferometry

descriptionPublicationkeyboard_double_arrow_right Article 01 Oct 1972 English Publisher:AIP PublishingJournal:Review of Scientific Instruments, volume 43, pages 1,498-1,500 (issn: 0034-6748, eissn: 1089-7623, Copyright policy )
Authors: D. S. Lo;

doi: 10.1063/1.1685474

Printed Circuit Board Evaluation by Holographic Interferometry

Abstract

Application of real time holographic interferometry for the examination of a printed circuit board is described. The procedures and the resulting holographic interferograms of two specific studies are presented: (1) The heat conduction of a spacer used for mounting transistors on a heat sink, and (2) the detection of inner layer short circuits on a multilayer printed circuit board.

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selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
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