This paper deals with the photothermal characterization of functionally graded materials (FGM) whose thermal properties are varying parallel to the sample surface. Simple experimental configurations and associated inversion procedures are proposed either for thermal mapping or for pitch-catch imaging mode. The photothermally induced periodic temperature field at the sample surface is first calculated using a specific code, then the inversion procedures are checked using a simulated set of data. Preliminary experimental results are presented outlining need of specific filter to cope with experimental noise.