Hemispherical dielectric permittivity cell

descriptionPublicationkeyboard_double_arrow_right Article 01 Jul 1978 English Publisher:AIP PublishingJournal:Review of Scientific Instruments, volume 49, pages 1,014-1,015 (issn: 0034-6748, eissn: 1089-7623,

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Authors: J S, Hayden; J G, Berberian;

doi: 10.1063/1.1135488

pmid: 18699247

Hemispherical dielectric permittivity cell

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Abstract

A three-terminal dielectric cell based on a hemispherical design is constructed for low-temperature measurements of dielectric permittivity. The cell has a small sample volume, is geometrically stable, and shows no frequency dependence of capacitance. Measurements on test samples are presented showing both cell constant stability data and the linearity of measured capacitance with dielectric constant.

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