Kelvin probe force microscopy

M. Nonnenmacher; M. P. O’Boyle; H. K. Wickramasinghe

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Applied Physics Lett...arrow_drop_down

Applied Physics Letters

Article . 1991 . Peer-reviewed

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https://dx.doi.org/10.1063/1.1...

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Kelvin probe force microscopy

descriptionPublicationkeyboard_double_arrow_right Article 24 Jun 1991 English Publisher:AIP PublishingJournal:Applied Physics Letters, volume 58, pages 2,921-2,923 (issn: 0003-6951, eissn: 1077-3118,

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Authors: M. Nonnenmacher; M. P. O’Boyle; H. K. Wickramasinghe;

doi: 10.1063/1.105227

Kelvin probe force microscopy

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Abstract

Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact potential difference. Images of gold, platinum, and palladium surfaces, taken in air, show a large contrast in the contact potential difference and demonstrate the basic concept.

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