Capacitance-voltage characteristics of alternating-current thin-film electroluminescent devices

R. C. McArthur; J. D. Davidson; J. F. Wager; I. Khormaei; C. N. King

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Applied Physics Letters

Article . 1990 . Peer-reviewed

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https://dx.doi.org/10.1063/1.1...

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Capacitance-voltage characteristics of alternating-current thin-film electroluminescent devices

descriptionPublicationkeyboard_double_arrow_right Article 07 May 1990 English Publisher:AIP PublishingJournal:Applied Physics Letters, volume 56, pages 1,889-1,891 (issn: 0003-6951, eissn: 1077-3118,

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Authors: R. C. McArthur; J. D. Davidson; J. F. Wager; I. Khormaei; C. N. King;

doi: 10.1063/1.103078

Capacitance-voltage characteristics of alternating-current thin-film electroluminescent devices

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Abstract

The capacitance-voltage (C-V) technique is proposed as a method for characterization of the electrical properties of alternating-current thin-film electroluminescent (ACTFEL) display devices. Analysis of the C-V and aging characteristics of ZnS:Mn ACTFEL devices indicates that the C-V technique is complementary to the charge-voltage technique in the extraction of device physics information.

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Oregon State University
United States

8 Research products, page 1 of 1

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