In this chapter, we have covered some of the general challenges in the physical stress of electronic devices. The benefits of using particles beams to evaluate the reliability of devices are various, such as a realistic error rate and a realistic error model. Additionally, thanks to the accelerated beam, a statistically significant amount of data can be gathered in a relatively short time (hours). However, the preparation of the setup is very challenging and, while there are some general guidelines, each facility has its own constraints. When performing beam experiments, it is fundamental to carefully design the setup. As beam experiments do not allow visibility as fault injection, it is necessary to ensure the test of all components and to test proper benchmarks. Finally, the correlation between beam experiments data and fault injection is still an open question.