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Technology and TCAD tools

Technology and TCAD tools

Abstract

Today much of the development of semiconductor devices and processes is done by TCAD as it offers unique possibilities in visualisation of processing steps, description of the physical changes and understanding of the interrelation of the process variables. Modelling of processes provides a way to interactively explore the fabrication process, studying the effects of process choices, leading to a 'virtual wafer fabrication' (VWF) design environment. TCAD simulation tools provide a controlled and repeatable numerical experiment that can yield information that cannot be measured experimentally. The main aim of a TCAD simulator tool is to match the simulation methodology as close as possible to the fabrication technology and their integration into the actual fabrication. For TCAD tools to be useful in a practical environment, they must be physically accurate, computationally robust and usable by semiconductor process engineers.

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Powered by OpenAIRE graph
Found an issue? Give us feedback
selected citations
These citations are derived from selected sources.
This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Citations provided by BIP!
popularity
This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network.
BIP!Popularity provided by BIP!
influence
This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically).
BIP!Influence provided by BIP!
impulse
This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network.
BIP!Impulse provided by BIP!
0
Average
Average
Average
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