This chapter has been concerned with DfT of, and test techniques for, analogue integrated filters. Many different testable filter structures have been presented. Typical DfT techniques, such as bypassing, multiplexing and OBT have been discussed. Most popular filters such as active-RC, OTA-C and SCs filters have been covered. Test of low-order and high-order filters have been addressed. DfT of OTA-C filters have been investigated, particularly, because this topic has not been so well studied as the testing of active-RC and SC filters. Many of the test concepts, structures and methods described in the chapter are also suitable for other analogue circuits, although they may be most useful for analogue filters as demonstrated in the chapter.