
The proposed feature selection method builds a histogram of the most stable features from random subsets of a training set and ranks the features based on a classifier based cross-validation. This approach reduces the instability of features obtained by conventional feature selection methods that occur with variation in training data and selection criteria. Classification results on four microarray and three image datasets using three major feature selection criteria and a naive Bayes classifier show considerable improvement over benchmark results.
FOS: Computer and information sciences, Communications Technologies, Artificial Intelligence (cs.AI), Artificial Intelligence and Image Processing, Electrical and Electronic Engineering not elsewhere classified, Computer Science - Artificial Intelligence, Computer Vision and Pattern Recognition (cs.CV), Computer Science - Computer Vision and Pattern Recognition, Electrical and Electronic Engineering
FOS: Computer and information sciences, Communications Technologies, Artificial Intelligence (cs.AI), Artificial Intelligence and Image Processing, Electrical and Electronic Engineering not elsewhere classified, Computer Science - Artificial Intelligence, Computer Vision and Pattern Recognition (cs.CV), Computer Science - Computer Vision and Pattern Recognition, Electrical and Electronic Engineering
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