IN this letter we report further observations made during our development of a new electron diffraction technique, which was introduced under the title of ‘;Real Space Crystallography’;1. This technique involves the use of bend contour patterns, which are produced in thin domed or saucer-shaped foil specimens when an aperture is inserted in the back focal plane of the objective lens of an electron microscope. Since the symmetry of these patterns is used to reveal the symmetry elements of crystal structures, we have now examined the effect of faults on the contour patterns. The sensitivity of the pole figures to changes in specimen thickness and accelerating voltage has also been studied.