A METHOD of quickly making observations by X-ray diffraction is needed for investigation of unstable phases and of structural rearrangements in crystals : it is also desirable in order to expedite the orienting of normal specimens for crystallography. The required direct observation and rapid recording have now been achieved by use of electronic intensification of the image of the diffraction pattern. It has proved possible to correct approximate settings of the crystal by inspection, and transient diffraction patterns have been observed. Exposure times for photographic recording range between 0.5 sec and 5 sec.