Measurement of Sporadic E-Layer lonization

descriptionPublicationkeyboard_double_arrow_right Article 01 Apr 1949 English Publisher:Springer Science and Business Media LLCJournal:Nature, volume 163, pages 528-529 (issn: 0028-0836, eissn: 1476-4687,

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Authors: K. RAWER;

doi: 10.1038/163528a0

Measurement of Sporadic E-Layer lonization

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Abstract

THE usual measure of sporadic E-layer ionization is the so-called 'critical frequency', that is, the highest reflected frequency for this layer. While this definition is suitable for all other ionospheric layers, it is not sufficient for the sporadic E-layer (Es), because it consists of ionized clouds and has no homogeneous ionization. Partial reflexion is a normal phenomenon for this layer.

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