
Abstract In this work we develop the concept of the ‘typical’ industrial ellipsometry user, discussing his/her needs and skills, compared to the scholarly user. Following this, we will give examples of industrial problems where spectroscopic ellipsometry (SE) was used to obtain the end result. Included will be an example of designing material with chosen optical constants, an example of measuring the thickness of thin metal films, and methods development for measuring a polymer/bio film on a glass substrate.
| selected citations These citations are derived from selected sources. This is an alternative to the "Influence" indicator, which also reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | 15 | |
| popularity This indicator reflects the "current" impact/attention (the "hype") of an article in the research community at large, based on the underlying citation network. | Top 10% | |
| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Top 10% | |
| impulse This indicator reflects the initial momentum of an article directly after its publication, based on the underlying citation network. | Average |
