
Abstract The Bauschinger effect in thin sputter-deposited Al and Cu films is studied by isothermally deforming the films alternately in tension and compression. Passivated films exhibit an unusual Bauschinger effect with reverse flow already occurring on unloading, while unpassivated films show little or no reverse flows when the film is fully unloaded.
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| influence This indicator reflects the overall/total impact of an article in the research community at large, based on the underlying citation network (diachronically). | Top 1% | |
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