Yield maps for nanoscale metallic multilayers

descriptionPublicationkeyboard_double_arrow_right Article 01 Mar 2004 English Publisher:Elsevier BVJournal:Scripta Materialia, volume 50, pages 757-761 (issn: 1359-6462,

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Authors: Adrienne V. Lamm; Peter M. Anderson;

doi: 10.1016/j.scriptamat.2003.11.040

Yield maps for nanoscale metallic multilayers

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Abstract

Abstract This manuscript presents maps for the macroscopic, in-plane, bi-axial tension to macroscopically yield a nanoscale multilayered thin film consisting of alternating phases that can plastically deform. The design parameters are volume fraction, bi-layer thickness, modulus mismatch, and lattice parameter mismatch.

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